Pattern Recognition
Recognition of partially occluded and deformed binary objects
Pattern Recognition Letters
Classification using scale and rotation tolerant shape signatures from convex hulls
ICAPR'05 Proceedings of the Third international conference on Pattern Recognition and Image Analysis - Volume Part II
Recognition of partially occluded and deformed binary objects
CAIP'05 Proceedings of the 11th international conference on Computer Analysis of Images and Patterns
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In this correspondence, we prove that the affine invariants, for image registration and object recognition, proposed recently by Yang and Cohen (see ibid., vol.8, no.7, p.934-46, July 1999) are algebraically dependent. We show how to select an independent and complete set of the invariants. The use of this new set leads to a significant reduction of the computing complexity without decreasing the discrimination power.