Error Tolerance in Server Class Processors

  • Authors:
  • J. A. Rivers;M. S. Gupta; Jeonghee Shin;P. N. Kudva;P. Bose

  • Affiliations:
  • IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA;-;-;-;-

  • Venue:
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Year:
  • 2011

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Abstract

This paper provides: 1) a very brief motivation and technological trend data to show why hard and soft errors are expected to be of increasing concern in the future; 2) a summary review of chip-level error tolerance practices today-with a brief reference to IBM's POWER6 and POWER7 designs; 3) open research challenges and current solution approaches of promise, based on published literature; and 4) concluding remarks.