Contour-based recognition

  • Authors:
  • Yuhui Quan

  • Affiliations:
  • School of Computer Science & Engineering, South China Univ. of Tech., Guangzhou 510006, China

  • Venue:
  • CVPR '12 Proceedings of the 2012 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
  • Year:
  • 2012

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Abstract

Contour is an important cue for object recognition. In this paper, built upon the concept of torque in image space, we propose a new contour-related feature to detect and describe local contour information in images. There are two components for our proposed feature: One is a contour patch detector for detecting image patches with interesting information of object contour, which we call the Maximal/Minimal Torque Patch (MTP) detector. The other is a contour patch descriptor for characterizing a contour patch by sampling the torque values, which we call the Multi-scale Torque (MST) descriptor. Experiments for object recognition on the Caltech-101 dataset showed that the proposed contour feature outperforms other contour-related features and is on a par with many other types of features. When combing our descriptor with the complementary SIFT descriptor, impressive recognition results are observed.