Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

Authors:
Brady Benware;Chris Schuermyer;Manish Sharma;Thomas Herrmann
Affiliations:
Mentor Graphics Corp., Wilsonville, OR, USA;Mentor Graphics Corp., Wilsonville, OR, USA;Mentor Graphics Corp., Wilsonville, OR, USA;GLOBALFOUNDRIES, Dresden, Germany
Venue:
IEEE Design & Test
Year:
2012

Citing 0
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DREAMS: DFM rule EvAluation using manufactured silicon

Proceedings of the International Conference on Computer-Aided Design

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Abstract

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