Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations

  • Authors:

  • Ronald DeShawn Blanton;Wing Chiu Tam;Xiaochun Yu;Jeffrey E. Nelson;Osei Poku

  • Affiliations:

  • Advanced Chip Testing Laboratory, Carnegie Mellon University,;Advanced Chip Testing Laboratory, Carnegie Mellon University,;Advanced Chip Testing Laboratory, Carnegie Mellon University,;Advanced Chip Testing Laboratory, Carnegie Mellon University,;Advanced Chip Testing Laboratory, Carnegie Mellon University,

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2012

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Abstract

Editor's note: