A pattern for reconstructing test code based on test coverage

  • Authors:

  • Kazunori Sakamoto;Hironori Washizaki;Takuto Wada;Yoshiaki Fukazawa

  • Affiliations:

  • Waseda University, Tokyo, Japan;Waseda University, Tokyo, Japan;Towers Quest Corporation, Tokyo, Japan;Waseda University, Tokyo, Japan

  • Venue:
  • Proceedings of the 1st Asian Conference on Pattern Languages of Programs
  • Year:
  • 2010

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Abstract

The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the pattern.