A new approach for measuring the value of patents based on structural indicators for ego patent citation networks

Authors:
Xiaojun Hu;Ronald Rousseau;Jin Chen
Affiliations:
Medical Information Centre, Zhejiang University School of Medicine, Hangzhou, 310058, China;KHBO (Association K.U.Leuven), Faculty of Engineering Technology, Zeedijk 101, 8400, Oostende, Belgium and IBW, Stadscampus, Universiteit Antwerpen (UA), Venusstraat 35, 2000, Antwerpen, Belgium, ...;College of Public Administration, Zhejiang University, Hangzhou, 310027, China
Venue:
Journal of the American Society for Information Science and Technology
Year:
2012

Citing 1
Cited 0

Using statistical testing in the evaluation of retrieval experiments

SIGIR '93 Proceedings of the 16th annual international ACM SIGIR conference on Research and development in information retrieval

Quantified Score

Hi-index	0.00

Visualization

Abstract

Technology sectors differ in terms of technological complexity. When studying technology and innovation through patent analysis it is well known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. A new multilayered approach to measure the technological value of patents based on ego patent citation networks (PCNs) is developed in this study. The results show that the structural indicators for the ego PCN developed in this contribution can characterize groups of patents and, hence, in an indirect way, the health of companies. © 2012 Wiley Periodicals, Inc.