Standardization of face image sample quality

Authors:
Xiufeng Gao;Stan Z. Li;Rong Liu;Peiren Zhang
Affiliations:
University of Science and Technology of China, Hefei, China;Center for Biometrics and Security Research & National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China;Center for Biometrics and Security Research & National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China;University of Science and Technology of China, Hefei, China
Venue:
ICB'07 Proceedings of the 2007 international conference on Advances in Biometrics
Year:
2007

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Abstract

Performance of biometric systems is dependent on quality of acquired biometric samples. Poor sample quality is a main reason for matching errors in biometric systems and may be the main weakness of some implementations. In this paper, we present an approach for standardization of facial image quality, and develop facial symmetry based methods for its assessment by which facial asymmetries caused by non-frontal lighting and improper facial pose can be measured. Experimental results are provided to illustrate the concepts, definitions and effectiveness.