Model composition in product lines and feature interaction detection using critical pair analysis

  • Authors:

  • Praveen Jayaraman;Jon Whittle;Ahmed M. Elkhodary;Hassan Gomaa

  • Affiliations:

  • Department of Information & Software Engineering, George Mason University, Fairfax, VA;Department of Information & Software Engineering, George Mason University, Fairfax, VA;Department of Information & Software Engineering, George Mason University, Fairfax, VA;Department of Information & Software Engineering, George Mason University, Fairfax, VA

  • Venue:
  • MODELS'07 Proceedings of the 10th international conference on Model Driven Engineering Languages and Systems
  • Year:
  • 2007

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Abstract

Software product lines (SPL) are an established technology for developing families of systems. In particular, they focus on modeling commonality and variability, that is, they are based on identifying features common to all members of the family and variable features that appear only in some members. Model-based development methods for product lines advocate the construction of SPL requirements, analysis and design models for features. This paper describes an approach for maintaining feature separation during modeling using a UML composition language based on graph transformations. This allows models of features to be reused more easily. The language can be used to compose the SPL models for a given set of features. Furthermore, critical pair analysis is used to detect dependencies and conflicts between features during analysis and design modeling. The approach is supported by a tool that allows automated composition of UML models of features and detection of some kinds of feature interactions.