Extensional equivalence for transition systems
Acta Informatica
Observation equivalence as a testing equivalence
Theoretical Computer Science
Testing against formal specifications: a theoretical view
TAPSOFT '91 Proceedings of the international joint conference on theory and practice of software development on Advances in distributed computing (ADC) and colloquium on combining paradigms for software development (CCPSD): Vol. 2
Formal verification of parallel programs
Communications of the ACM
Software product lines: practices and patterns
Software product lines: practices and patterns
Testing Concurrent Systems: A Formal Approach
CONCUR '99 Proceedings of the 10th International Conference on Concurrency Theory
Precongruence formats for decorated trace semantics
ACM Transactions on Computational Logic (TOCL)
Product family testing: a survey
ACM SIGSOFT Software Engineering Notes
Practical Model-Based Testing: A Tools Approach
Practical Model-Based Testing: A Tools Approach
Model-based testing for software product lines
Model-based testing for software product lines
Modal interfaces: unifying interface automata and modal specifications
EMSOFT '09 Proceedings of the seventh ACM international conference on Embedded software
Modal I/O automata for interface and product line theories
ESOP'07 Proceedings of the 16th European conference on Programming
Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 1
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
ICST '10 Proceedings of the 2010 Third International Conference on Software Testing, Verification and Validation
Incremental Test Generation for Software Product Lines
IEEE Transactions on Software Engineering
Software product line testing - A systematic mapping study
Information and Software Technology
Automated incremental pairwise testing of software product lines
SPLC'10 Proceedings of the 14th international conference on Software product lines: going beyond
Feature Interaction Aware Test Case Generation for Embedded Control Systems
Electronic Notes in Theoretical Computer Science (ENTCS)
A model-checking tool for families of services
FMOODS'11/FORTE'11 Proceedings of the joint 13th IFIP WG 6.1 and 30th IFIP WG 6.1 international conference on Formal techniques for distributed systems
Model-based coverage-driven test suite generation for software product lines
Proceedings of the 14th international conference on Model driven engineering languages and systems
Feature models, grammars, and propositional formulas
SPLC'05 Proceedings of the 9th international conference on Software Product Lines
Incremental model-based testing of delta-oriented software product lines
TAP'12 Proceedings of the 6th international conference on Tests and Proofs
Model-based pairwise testing for feature interaction coverage in software product line engineering
Software Quality Control
Approaches for mastering change
ISoLA'12 Proceedings of the 5th international conference on Leveraging Applications of Formal Methods, Verification and Validation: technologies for mastering change - Volume Part I
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Software Product Lines (SPLs) are a promising approach for efficiently engineering similar variants and/or evolving versions of software products. SPLs propagate systematic reuse of design artifacts between variants based on commonality and variability specifications in terms of features. Adopting reuse principles also to methods for behavioral conformance verification of product variants to their formal specifications, e.g., using model-based testing, is still an open problem. The sound reuse of verification artifacts such as test cases and test results is challenging due to the syntax-oriented and cross-cutting nature of recent feature-oriented SPL modeling approaches which obstructs reasoning about the behavioral impact of variability. Therefore, we introduce a formal framework for reasoning about artifact reuse in model-based SPL conformance testing. Based on a modal labeled transition system with explicit feature annotations as semantical ground model, we propose a behavioral notion of commonality by means of parameterized testing preorder relations for decorated trace semantics. Thereupon, applications to the reuse of SPL test artifacts are proposed.