Effective WIP dependent lot release policies: a discrete event simulation approach

Authors:
Raha Akhavan-Tabatabaei;Carlos F. Ruiz Salazar
Affiliations:
Universidad de los Andes, Bogotá, Colombia;Universidad de los Andes, Bogotá, Colombia
Venue:
Proceedings of the Winter Simulation Conference
Year:
2011

Citing 1
Cited 1

CONLOAD—a new lot release rule for semiconductor wafer fabs

Proceedings of the 31st conference on Winter simulation: Simulation---a bridge to the future - Volume 1

Evaluation of lot release policies for cycle time improvement in semiconductor manufacturing systems: a Petri net approach

Proceedings of the Winter Simulation Conference

Quantified Score

Hi-index	0.00

Visualization

Abstract

In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.