Dynamic angle selection in binary tomography

  • Authors:
  • K. Joost Batenburg;Willem Jan Palenstijn;PéTer BaláZs;Jan Sijbers

  • Affiliations:
  • Centrum Wiskunde & Informatica, Science Park 123, NL-1098 XG Amsterdam, The Netherlands and Vision Lab, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium;Vision Lab, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium;Department of Image Processing and Computer Graphics, University of Szeged, Árpád tér 2, H-6720 Szeged, Hungary;Vision Lab, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium

  • Venue:
  • Computer Vision and Image Understanding
  • Year:
  • 2013

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Abstract

In this paper, we present an algorithm for the dynamic selection of projection angles in binary tomography. Based on the information present in projections that have already been measured, a new projection angle is computed, which aims to maximize the information gained by adding this projection to the set of measurements. The optimization model used for angle selection is based on a characterization of solutions of the binary reconstruction problem, and a related definition of information gain. From this formal model, an algorithm is obtained by several approximation steps. Results from a series of simulation experiments demonstrate that the proposed angle selection scheme is indeed capable of finding angles for which the reconstructed image is much more accurate than for the standard angle selection scheme.