Multiresolution Gray-Scale and Rotation Invariant Texture Classification with Local Binary Patterns
IEEE Transactions on Pattern Analysis and Machine Intelligence
Face Description with Local Binary Patterns: Application to Face Recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence
Enhanced local texture feature sets for face recognition under difficult lighting conditions
IEEE Transactions on Image Processing
Training-Free, Generic Object Detection Using Locally Adaptive Regression Kernels
IEEE Transactions on Pattern Analysis and Machine Intelligence
IEEE Transactions on Pattern Analysis and Machine Intelligence
Face Recognition by Exploring Information Jointly in Space, Scale and Orientation
IEEE Transactions on Image Processing
Face Verification Using the LARK Representation
IEEE Transactions on Information Forensics and Security
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This paper presents a robust and simple metric approach named Force Work Induced Metric (FWIM) according to a Physical model. A novel image local descriptor based on FWIM (FWIM-LD) is then introduced for face verification. FWIM-LD captures the local structure information between central pixel and its neighbors effectively. PCA thus is used to obtain the low-dimensional and significant features. Subsequently, we employ the binary-like face representation method to further improve the face verification rate. Experimental results on the challenging benchmark "Labeled Faces in the Wild" (LFW) dataset demonstrate that the proposed method achieves better performance than the state-of-the-art algorithms.