Background model based on statistical local difference pattern

  • Authors:
  • Satoshi Yoshinaga;Atsushi Shimada;Hajime Nagahara;Rin-ichiro Taniguchi

  • Affiliations:
  • Kyushu University, Fukuoka, Japan;Kyushu University, Fukuoka, Japan;Kyushu University, Fukuoka, Japan;Kyushu University, Fukuoka, Japan

  • Venue:
  • ACCV'12 Proceedings of the 11th international conference on Computer Vision - Volume Part I
  • Year:
  • 2012

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Abstract

We present a robust background model for object detection and report its evaluation results using the database of Background Models Challenge (BMC). Our background model is based on a statistical local feature. In particular, we use an illumination invariant local feature and describe its distribution by using a statistical framework. Thanks to the effectiveness of the local feature and the statistical framework, our method can adapt to both illumination and dynamic background changes. Experimental results, which are done thanks to the database of BMC, show that our method can detect foreground objects robustly against background changes.