A cookbook for using the model-view controller user interface paradigm in Smalltalk-80
Journal of Object-Oriented Programming
The AETG System: An Approach to Testing Based on Combinatorial Design
IEEE Transactions on Software Engineering
The patterns handbooks: techniques, strategies, and applications
The patterns handbooks: techniques, strategies, and applications
Software Fault Interactions and Implications for Software Testing
IEEE Transactions on Software Engineering
Automated analysis of feature models 20 years later: A literature review
Information Systems
Properties of realistic feature models make combinatorial testing of product lines feasible
Proceedings of the 14th international conference on Model driven engineering languages and systems
PACOGEN: Automatic Generation of Pairwise Test Configurations from Feature Models
ISSRE '11 Proceedings of the 2011 IEEE 22nd International Symposium on Software Reliability Engineering
Pairwise testing for software product lines: comparison of two approaches
Software Quality Control
Towards automated testing and fixing of re-engineered feature models
Proceedings of the 2013 International Conference on Software Engineering
ICSTW '13 Proceedings of the 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops
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Specific requirements of clients lead to the development of variants of the same software. These variants form a Software Product Line (SPL). Ideally, testing a SPL involves testing all the software products that can be configured through the combination of features. This, however, is intractable in practice since a) large SPLs can lead to millions of possible software variants and b) the testing process is usually limited by budget and time constraints. To overcome this problem, this paper introduces PLEDGE, an open source tool that selects and prioritizes the product configurations maximizing the feature interactions covered. The uniqueness of PLEDGE is that it bypasses the computation of the feature interactions, allowing to scale to large SPLs.