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Model-based testing involves formal models for test generation. This paper suggests regular grammars for event-based modeling. This model, represented in BNF, will then be systematically modified by well-defined mutation operators in order to generate fault models, called mutants. Specific algorithms apply to both the model of the system under consideration and the mutants to generate test cases. While existing methods focus on single events the approach introduced in this paper suggests considering event sequences of length k≥1, that is, k-sequences. The approach also enables to cope with a tough problem encountered in mutation-oriented testing: the elimination of mutants that are equivalent to the original model, and mutants that model the same faults multiple times. These mutants lead to unproductive test suites that cause wasting of resources. The approach proposed devises strategies to exclude the mentioned mutants in that they will not be generated at all.