ACM Transactions on Programming Languages and Systems (TOPLAS)
Adventures in stochastic processes
Adventures in stochastic processes
Performance Analysis of Synchronized Iterative Algorithms on Multiprocessor Systems
IEEE Transactions on Parallel and Distributed Systems
Event scheduling schemes for time warp on distributed systems
WSC '96 Proceedings of the 28th conference on Winter simulation
Predicting the performance of synchronous discrete event simulation systems
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Reusing simulation components: generalizing: is it possible to create all-purpose simulations?
Proceedings of the 34th conference on Winter simulation: exploring new frontiers
Predicting the Performance of Synchronous Discrete Event Simulation
IEEE Transactions on Parallel and Distributed Systems
Performance evaluation of a CMB protocol
Proceedings of the 38th conference on Winter simulation
Reversible Parallel Discrete Event Formulation of a TLM-Based Radio Signal Propagation Model
ACM Transactions on Modeling and Computer Simulation (TOMACS)
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Grain size, the amount of computations between communication points, is a quantity to be tuned appropriately depending on the characteristics of the underlying parallel and distributed machines, application problems, and simulation protocols. As target machines for optimistic protocol, the architectural characteristics of a cluster of DEC Alpha workstations are compared to the MasPar MP-2's in view of parallel logic simulation. We study the effects of varying grain size on several performance metrics when more than one logical processes are assigned to a physical processor on distributed systems. We obtain analytic formulas for the total number of simulation cycles and the total execution time, and find the optimal grain sizes for several benchmark circuits when the number of processors varies. Our experimental results show that the grain size greatly affects the performance of parallel logic simulation on distributed systems, and the effects vary depending on the machine independent factors.