A data-driven reflectance model
ACM SIGGRAPH 2003 Papers
Sparse reconstruction by separable approximation
IEEE Transactions on Signal Processing
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BRDF acquisition is a tedious operation, since it requires measuring 4D data. On one side of the spectrum lie explicit methods, which perform many measurements to potentially produce very accurate reectance data after interpolation [Matusik et al. 2003]. These methods are generic but practically difficult to setup and produce high volume data. On the other side, acquisition methods based on parametric models implicitly reduce the infinite dimensionality of the BRDF space to the number of parameters, allowing acquisition with few samples. However, parametric methods require non linear optimization. They become unstable when the number of parameters is large, with no guaranty that a given parametric model can ever fit particular measurements.