Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

Authors:
Tian Xia;Rohit Shetty;Timothy Platt;Mustapha Slamani
Affiliations:
College of Engineering and Mathematical Sciences, The University of Vermont, Burlington, USA 05405;College of Engineering and Mathematical Sciences, The University of Vermont, Burlington, USA 05405 and RF/Mixed Signal Test Development, IBM Corporation, Essex Junction, USA 05452;RF/Mixed Signal Test Development, IBM Corporation, Essex Junction, USA 05452;RF/Mixed Signal Test Development, IBM Corporation, Essex Junction, USA 05452
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2013

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Abstract

In this paper, we present a new multi-tone test signal generation method with different frequency tones uniformly distributed across a wideband spectrum. It employs OFDM (orthogonal frequency-division multiplexing) spread spectrum technique to allow users to define signal parameters with a great flexibility as per the test requirements. This OFDM method essentially starts from the frequency sampling and then conversion to generate time domain signals, which can significantly reduce the number of data points in the signal generation. Response of such test signals from the device under test (DUT) can be captured and analyzed so as to characterize frequency response associated with each frequency tone. For validation, simulations with Matlab Simulink tool and hardware implementation on a Xilinx Virtex5 FPGA board are developed.