Decomposing Global Light Transport Using Time of Flight Imaging

Authors:
Di Wu;Andreas Velten;Matthew O'toole;Belen Masia;Amit Agrawal;Qionghai Dai;Ramesh Raskar
Affiliations:
MIT Media Lab, Cambridge, USA 02139 and Tsinghua University, Beijing, China;Medical Engineering, Morgridge Institute for Research, Madison, USA 53715 and Laboratory for Optical and Computational Instrumentation, University of Wisconsin at Madison, Madison, USA 53706;MIT Media Lab, Cambridge, USA 02139 and University of Toronto, Toronto, Canada;MIT Media Lab, Cambridge, USA 02139 and Universidad de Zaragoza, Saragossa, Spain;Mitsubishi Electric Research Labs, Cambridge, USA;Department of Automation, Tsinghua University, Room 410, Central Main Building, China;MIT Media Lab, Cambridge, USA 02139
Venue:
International Journal of Computer Vision
Year:
2014

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Abstract

Global light transport is composed of direct and indirect components. In this paper, we take the first steps toward analyzing light transport using the high temporal resolution information of time of flight (ToF) images. With pulsed scene illumination, the time profile at each pixel of these images separates different illumination components by their finite travel time and encodes complex interactions between the incident light and the scene geometry with spatially-varying material properties. We exploit the time profile to decompose light transport into its constituent direct, subsurface scattering, and interreflection components. We show that the time profile is well modelled using a Gaussian function for the direct and interreflection components, and a decaying exponential function for the subsurface scattering component. We use our direct, subsurface scattering, and interreflection separation algorithm for five computer vision applications: recovering projective depth maps, identifying subsurface scattering objects, measuring parameters of analytical subsurface scattering models, performing edge detection using ToF images and rendering novel images of the captured scene with adjusted amounts of subsurface scattering.