Improving conformance and interoperability testing

  • Authors:
  • James D. Kindrick;John A. Sauter;Robert S. Matthews

  • Affiliations:
  • Industrial Technology Institute, Ann Arbor, MI;Industrial Technology Institute, Ann Arbor, MI;Industrial Technology Institute, Ann Arbor, MI

  • Venue:
  • StandardView
  • Year:
  • 1996

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Abstract