Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process

Authors:
Eric W. Johnson;Luis A. Castillo;Jay B. Brockman
Affiliations:
Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN;Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN;Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN
Venue:
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Year:
1996

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