A system for measuring surface facet orientation from atomic force microscope data

  • Authors:
  • John Hagedorn;Holly Rushmeier;John Blendell;Mark Vaudin

  • Affiliations:
  • Computing and Applied Mathematics Laboratory, National Institute of Standards and Technology, Gaithersburg, MD;IBM TJ Watson Research Center, H0-D06, 30 Saw Mill River Road, Hawthorne, NY and Computing and Applied Mathematics Laboratory, National Institute of Standards and Technology, Gaithersburg, MD;Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD;Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD

  • Venue:
  • Proceedings of the 7th conference on Visualization '96
  • Year:
  • 1996

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Abstract