An analytical comparison of the fault-detecting ability of data flow testing techniques

  • Authors:

  • Phyllis G. Frankl;Elaine J. Weyuker

  • Affiliations:

  • Computer Science Department, Polytechnic University, 6 Metrotech Center, Brooklyn, N.Y.;Courant Institute of Mathematical Sciences, New York University, 251 Mercer Street, New York, NY

  • Venue:
  • ICSE '93 Proceedings of the 15th international conference on Software Engineering
  • Year:
  • 1993

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Abstract