Pattern matching for clone and concept detection

  • Authors:
  • K. A. Kontogiannis;R. Demori;E. Merlo;M. Galler;M. Bernstein

  • Affiliations:
  • McGill Univ., Montre´al, P.Q., Canada;McGill Univ., Montre´al, P.Q., Canada;McGill Univ., Montre´al, P.Q., Canada;McGill Univ., Montre´al, P.Q., Canada;McGill Univ., Montre´al, P.Q., Canada

  • Venue:
  • Reverse engineering
  • Year:
  • 1996

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Abstract