Metrology for information technology

• Authors:

• Lisa Carnahan;Gary Carver;Martha Gray;Michael Hogan;Theodore Hopp;Jeffrey Horlick;Gordon Lyon;Elena Messina

• Affiliations:

• National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD

• Venue:
• StandardView
• Year:
• 1997