Regression testing in an industrial environment

  • Authors:
  • Akira K. Onoma;Wei-Tek Tsai;Mustafa Poonawala;Hiroshi Suganuma

  • Affiliations:
  • Hitachi Software Engineering Co., Yokohama, Japan;Univ. of Minnesota, Minneapolis;Univ. of Minnesota, Minneapolis;Hitachi Software Engineering Co., Yokohama, Japan

  • Venue:
  • Communications of the ACM
  • Year:
  • 1998

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Abstract