Theory and Design of Adjacent Asymmetric Error Masking Codes

  • Authors:
  • Luca G. Tallini;Bella Bose

  • Affiliations:
  • Univ. di Salerno, Salerno, Italy;Oregon State Univ., Corvallis, OR

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1998

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Abstract

Recently, Matsuzawa and Fujiwara proposed a novel scheme to mask line faults of bus line circuits (such as address buses) due to short circuit defects between adjacent lines. In this paper, first we propose the fundamental theory and, then, present some efficient designs of these codes. Some lower and upper bounds for the optimal codes are also given.