Lessons from BMIR-J2: a test collection for Japanese IR systems

Authors:
Tsuyoshi Kitani;Yasushi Ogawa;Tetsuya Ishikawa;Haruo Kimoto;Ikuo Keshi;Jun Toyoura;Toshikazu Fukushima;Kunio Matsui;Yoshihiro Ueda;Tetsuya Sakai;Takenobu Tokunaga;Hiroshi Tsuruoka;Hidekazu Nakawatase;Teru Agata
Affiliations:
Laboratory for Information Technology, NTT Data Corporation;Ricoh;ULIS;NTT;SHARP;Mitsubishi Electric;NEC;Fujitsu Laboratories;Fuji Xerox;Toshiba;Tokyo Institute of Technology;ERI, Univ of Tokyo;NTT;Keio Univ.
Venue:
Proceedings of the 21st annual international ACM SIGIR conference on Research and development in information retrieval
Year:
1998

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