Polarization Phase-Based Method For Material Classification In Computer Vision

  • Authors:
  • Hua Chen;Lawrence B. Wolff

  • Affiliations:
  • Computer Vision Laboratory, Department of Computer Science, The Johns Hopkins University, Baltimore, Maryland 21218. E-mail: wolff@cs.jhu.edu;Computer Vision Laboratory, Department of Computer Science, The Johns Hopkins University, Baltimore, Maryland 21218. E-mail: wolff@cs.jhu.edu

  • Venue:
  • International Journal of Computer Vision
  • Year:
  • 1998

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Abstract

A robust and accurate polarization phase-based technique formaterial classification is presented. The novelty of this technique isthree-fold in (i) its theoretical development, (ii) application, and, (iii)experimental implementation. The concept of phase of polarization of a lightwave is introduced to computer vision for discrimination between materialsaccording to their intrinsic electrical conductivity, such as distinguishingconducting metals, and poorly conducting dielectrics. Previous work has usedintensity, color and polarization component ratios. This new method isbased on the physical principle that metals retard orthogonal components oflight upon reflection while dielectrics do not. This method has significantcomplementary advantages with respect to existing techniques, iscomputationally efficient, and can be easily implemented with existingimaging technology. Experiments for real circuit board inspection,nonconductive and conductive glass, and, outdoor object recognition havebeen performed to demonstrate its accuracy and potential capabilities.