Validation and verification of the simulation model of a photolithography process in semiconductor manufacturing

  • Authors:
  • Nirupama Nayani;Mansooreh Mollaghasemi

  • Affiliations:
  • Cirent Semiconductor, 9333 S. John Young Parkway, Orlando, FL;Department of Industrial Engineering and Management Systems, University of Central Florida, Orlando, FL

  • Venue:
  • Proceedings of the 30th conference on Winter simulation
  • Year:
  • 1998

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Abstract