An approach to modeling labor and machine down time in semiconductor fabrication

• Authors:

• Susan S. Baum;Cheryl M. O'Donnell

• Affiliations:

• NCR Microelectronic Products, 2001 Danfield Ct., Fort Collins, Colorado;NCR Microelectronic Products, 2001 Danfield Ct., Fort Collins, Colorado

• Venue:
• WSC '91 Proceedings of the 23rd conference on Winter simulation
• Year:
• 1991