A neural network as a quality control monitor of an intelligent system
Authors:
Ray R. Hashemi;John R. Talburt;Meena Velusamy
Affiliations:
Department of Computer and Information Science, University of Arkansas at Little Rock;Department of Computer and Information Science, University of Arkansas at Little Rock;Department of Computer and Information Science, University of Arkansas at Little Rock
Venue:
SAC '95 Proceedings of the 1995 ACM symposium on Applied computing