A method for test data selection

Authors:
F. R. D. Velasco
Affiliations:
Wang Institute, Tyngsboro, MA
Venue:
Journal of Systems and Software
Year:
1987

Citing 0
Cited 1

Approaches to specification-based testing

TAV3 Proceedings of the ACM SIGSOFT '89 third symposium on Software testing, analysis, and verification

Quantified Score

Hi-index	0.00

Visualization

Abstract