Rating of pattern classifications in multi-layer perceptrons: theoretical background and practical results
Authors:
W. Ritschel;T. Pfeifer;R. Grob
Affiliations:
Aachen University of Technology, Institute of Machine Tools and Production Engineering;Aachen University of Technology, Institute of Machine Tools and Production Engineering;Aachen University of Technology, Institute of Machine Tools and Production Engineering
Venue:
SAC '94 Proceedings of the 1994 ACM symposium on Applied computing