Rating of pattern classifications in multi-layer perceptrons: theoretical background and practical results

  • Authors:
  • W. Ritschel;T. Pfeifer;R. Grob

  • Affiliations:
  • Aachen University of Technology, Institute of Machine Tools and Production Engineering;Aachen University of Technology, Institute of Machine Tools and Production Engineering;Aachen University of Technology, Institute of Machine Tools and Production Engineering

  • Venue:
  • SAC '94 Proceedings of the 1994 ACM symposium on Applied computing
  • Year:
  • 1994

Quantified Score

Hi-index 0.00

Visualization

Abstract