Mining IC test data to optimize VLSI testing

Authors:
Tony Fountain;Thomas Dietterich;Bill Sudyka
Affiliations:
San Diego Supercomputer Center, UCSD, 9500 Gilman Dr., La Jolla, CA;Oregon State University, 303 Dearborn Hall, Corvallis, OR;Hewlett Packard Company, 1000 NE Circle Blvd., Corvallis, OR
Venue:
Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining
Year:
2000

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