Depth first generation of long patterns

  • Authors:
  • Ramesh C. Agarwal;Charu C. Aggarwal;V. V. V. Prasad

  • Affiliations:
  • IBM T. J. Watson Research Center, Yorktown Heights, NY;IBM T. J. Watson Research Center, Yorktown Heights, NY;IBM T. J. Watson Research Center, Yorktown Heights, NY

  • Venue:
  • Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining
  • Year:
  • 2000

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Abstract