Use of the LRU stack depth distribution for simulation of paging behavior

Authors:
Rollins Turner;Bill Strecker
Affiliations:
Digital Equipment Corp., Maynard, MA;Digital Equipment Corp., Maynard, MA
Venue:
Communications of the ACM
Year:
1977

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Abstract

Two families of probability distributions were needed for use by a virtual memory simulation model: headway between page fault distributions, and working set size distributions. All members of both families can be derived from the LRU stack depth distribution. Simple expressions for the computation of both kinds of distributions are given. Finally, examples are given of both families of distributions as computed from a published stack depth distribution.