Hierarchical characterization of analog integrated CMOS circuits

  • Authors:
  • J. Ecküller;M. Gröpl;H. Gräb

  • Affiliations:
  • -;-;-

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 1998

Quantified Score

Hi-index 0.00

Visualization

Abstract

This paper presents a new method for hierarchical characterization of analog integrated circuits. For each circuit class, a fundamental set of performances is defined and extracted topology independently. A circuit being characterized is decomposed in general subcircuits. Sizing rules of these topology independent subcircuits are included into the characterization by functional constraints. In this way, bad circuit sizing is detected and located.