Sensitivity of parallel applications to large differences in bandwidth and latency in two-layer interconnects

  • Authors:
  • Aske Plaat;Henri E. Bal;Rutger F. H. Hofman;Thilo Kielmann

  • Affiliations:
  • -;-;-;-

  • Venue:
  • Future Generation Computer Systems
  • Year:
  • 2001

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Abstract