Application of Wiener-Hammerstein models for modeling of light flickering severity-meter

  • Authors:
  • Michal Szyper;Andrzej Bien

  • Affiliations:
  • Univ. of Mining and Metallurgy, Kraków, Poland;Univ. of Mining and Metallurgy, Kraków, Poland

  • Venue:
  • Systems Analysis Modelling Simulation
  • Year:
  • 2001

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Abstract

Model studies of measuring systems may be an effective tool for determination of their static and dynamic characteristics, quality assessment and selection of optimum parameters and structure. However, such studies may be performed only when we will apply in likelihood models of system, i.e., which are able to map real properties of the systems. By Wiener-Hammerstein models were built a model of a meter of a flicker's severity. This model includes nonlinear static characteristic and linear dynamic properties. A structure of the flickermeter's model as well as its parameters were selected in accordance with the actual standards. The results of tests show that the model has properties which are recommended b standards. It allows to accept a theses that a models' structure by a structure of a measuring system leads to correct solutions.