Identifying Efficient Combinations of Error Detection Mechanisms Based on Results of Fault Injection Experiments

Authors:
A. Steininger;C. Scherrer
Affiliations:
Vienna Univ. of Technology, Vienna, Austria;Vienna Univ. of Technology, Vienna, Austria
Venue:
IEEE Transactions on Computers - Special issue on fault-tolerant embedded systems
Year:
2002

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Abstract

We introduce novel performance ratings for error detection mechanisms. Given a proper setup of the fault injection experiments, these ratings can be directly computed from raw readout data. They allow the evaluation of the overall performance of arbitrary combinations of mechanisms without the need for further experiments. With this means we can determine a minimal subset of mechanisms that still provides the required performance.