Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields

Authors:
Joost van de Weijer;Lucas J. van Vliet;Piet W. Verbeek;Michael van Ginkel
Affiliations:
Univ. of Amsterdam, Amsterdam, The Netherlands;Delft Univ. of Technology, Deift, The Netherlands;Delft Univ. of Technology, Deift, The Netherlands;Delft Univ. of Technology, Deift, The Netherlands
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
2001

Citing 9
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Abstract

Curved oriented patterns are dominated by high frequencies and exhibit zero gradients on ridges and valleys. Existing curvature estimators fail here. The characterization of curved oriented patterns based on translation invariance lacks an estimation of local curvature and yields a biased curvature-dependent confidence measure. Using parameterized curvilinear models we measure the amount of local gradient energy along the model gradient as a function of model curvature. Minimizing the residual energy yields a closed-form solution for the local curvature estimate and the corresponding confidence measure. We show that simple curvilinear models are applicable in the analysis of a wide variety of curved oriented patterns.