Comparing systems via stochastic simulation: an enhanced two-stage selection procedure

  • Authors:
  • E. Jack Chen;W. David Kelton

  • Affiliations:
  • University of Cincinnati, Cincinnati, OH;University of Cincinnati, Cincinnati, OH

  • Venue:
  • Proceedings of the 32nd conference on Winter simulation
  • Year:
  • 2000

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Abstract

This paper discusses implementation of a two-stage procedure to determine the simulation run length for selecting the best of k designs. We purpose an Enhanced Two-Stage Selection (ETSS) procedure. The number of additional replications at the second stage for each design is determined by both the variances of the sample means and the differences of the sample means of alternative designs. We show that the ETSS procedure gives valid selections with significantly reduced simulation replications compared to Rinott's procedure. An experimental performance evaluation demonstrates the validity of the ETSS procedure.