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ACM SIGPLAN Notices
The derivation of test cases from SDL specifications
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ACM-SE 20 Proceedings of the 20th annual Southeast regional conference
Fault-Tolerant Design Strategies for High Reliability and Safety
IEEE Transactions on Computers
Contour Line and Geographic Feature Extraction from USGS Color Topographical Paper Maps
IEEE Transactions on Pattern Analysis and Machine Intelligence
“Recommended mathematical topics for computer science majors”
SIGCSE '77 Proceedings of the eighth SIGCSE technical symposium on Computer science education
Another look at the discrete structures course
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The why and how of discrete structures
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Realization of Boolean Expressions by Atomic Digraphs
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Substructure discovery using minimum description length and background knowledge
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