Patterns and pattern-matching in trees: an analysis

  • Authors:
  • Jean-Marc Steyaert;Philippe Flajolet

  • Affiliations:
  • Ecole Polytechnique, Palaiseau Cedex, France;INRIA Domaine de Voluceau Rocquencourt, Le Chesnay, France

  • Venue:
  • Information and Control
  • Year:
  • 1984

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Abstract