A new method to evaluate software artifacts against predefined profiles

Authors:
Maurizio Morisio;Ioannis Stamelos;Alexis Tsoukias
Affiliations:
Politecnico di Torino, 24, Corso Duca degli Abruzzi, 10129 Torino Italy;Aristotle University, 54006 Thessaloniki Greece;Université Paris Dauphine, Paris, France
Venue:
SEKE '02 Proceedings of the 14th international conference on Software engineering and knowledge engineering
Year:
2002

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Abstract

Software artifacts are characterised by many attributes, each one in its turn can be measured by one or more measures. In several cases the software artifact has to be evaluated as a whole, thus raising the problem of aggregating measures to give an overall, single view on the artifact.This paper presents a method to aggregate measures, that works comparing the artifact with predefined, ideal artifacts, or profiles. Profiles are defined starting fromranges of values on measures of attributes. The method is based on two main phases, namely definition of the evaluation model and application of the evaluation model, and is presented in a simplified case study that deals with evaluating the level of quality of an asset to decide if accepting it in a reuse repository. The advantages of the method are that it allows using ordinal scales, while it deals explicitly with preferences expressed, implicitly or explicitly, by the evaluator.