Process capability indices: overview and extensions

  • Authors:

  • Zachary G. Stoumbos

  • Affiliations:

  • Department of Management Science and Information Systems and Rutgers Center for Operations Research (RUTCOR) 180 University Avenue, Rutgers, The State University of New Jersey, Newark, NJ

  • Venue:
  • Nonlinear Analysis: Real World Applications
  • Year:
  • 2002

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Abstract

The process capability indices Cp, Cp*, CPL, CPU, CPL*, CPU* Cpk Cpk* Cpm and Cpm* are presented and related to process parameters. These indices form a complementary system of measures of performance and are used by a number of U.S. and Japanese industries. Some properties of an estimator of Cpm, Ĉpm are given, and the operating characteristic curve approach is used to analyze Ĉp, Ĉpm and Ĉp where Ĉpm and Ĉpm are estimators of Ĉp and Ĉpm respectively. Two tables for the analysis and use of Ĉp and Ĉpm are included, and an example of application of Ĉp, Ĉpm, and Ĉpk is provided, where Ĉpk is an estimator of Ĉpk. Finally, criticisms and benefits of the use of process capability indices are presented.