An experimental evaluation of the assumption of independence in multiversion programming
IEEE Transactions on Software Engineering
Software reliability: measurement, prediction, application
Software reliability: measurement, prediction, application
An Applicable Family of Data Flow Testing Criteria
IEEE Transactions on Software Engineering
Perturbation Techniques for Detecting Domain Errors
IEEE Transactions on Software Engineering
A Formal Evaluation of Data Flow Path Selection Criteria
IEEE Transactions on Software Engineering
Partition Testing Does Not Inspire Confidence (Program Testing)
IEEE Transactions on Software Engineering
PIE: A Dynamic Failure-Based Technique
IEEE Transactions on Software Engineering
Faults on its sleeve: amplifying software reliability testing
ISSTA '93 Proceedings of the 1993 ACM SIGSOFT international symposium on Software testing and analysis
Partition testing, stratified sampling, and cluster analysis
SIGSOFT '93 Proceedings of the 1st ACM SIGSOFT symposium on Foundations of software engineering
IEEE Software
A reliability model combining representative and directed testing
Proceedings of the 18th international conference on Software engineering
Validation, Verification, and Testing of Computer Software
ACM Computing Surveys (CSUR)
Engineering Software Under Statistical Quality Control
IEEE Software
Are We Testing for True Reliability?
IEEE Software
Operational Profiles in Software-Reliability Engineering
IEEE Software
The Infeasibility of Quantifying the Reliability of Life-Critical Real-Time Software
IEEE Transactions on Software Engineering
An experiment in estimating reliability growth under both representative and directed testing
Proceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis
Reliability growth modeling from fault failure rates
ACM SIGSOFT Software Engineering Notes
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A reliability growth model is presented that permits prediction of operational reliability without requiring that testing be conducted according to the operation profile of the program input space. Compared to prior growth models, this one shifts the observed random variable from interfailure time to a post‐mortem analysis of the debugged faults, using order statistics to combine the observed failure rates of faults no matter how those faults were detected. The primary advantages of this model are: the flexibility it offers to test planners, as the choice of testing method is no longer solely determined by the desire to predict operational reliability, and more robust experimental designs can be formulated by taking advantage of a wider variety of options for data collection.