The category-partition method for specifying and generating fuctional tests
Communications of the ACM
Partition Testing Does Not Inspire Confidence (Program Testing)
IEEE Transactions on Software Engineering
STATEMATE applied to statistical software testing
ISSTA '93 Proceedings of the 1993 ACM SIGSOFT international symposium on Software testing and analysis
Markov chain techniques for software testing and reliability analysis
Markov chain techniques for software testing and reliability analysis
A Markov Chain Model for Statistical Software Testing
IEEE Transactions on Software Engineering
Planning and Certifying Software System Reliability
IEEE Software
The Automatic Generation of Load Test Suites and the Assessment of the Resulting Software
IEEE Transactions on Software Engineering
Rare Failure-State in a Markov Chain Model for Software Reliability
ISSRE '99 Proceedings of the 10th International Symposium on Software Reliability Engineering
Queue - Quality Assurance
Combining test case generation for component and integration testing
Proceedings of the 3rd international workshop on Advances in model-based testing
A genetic approach for random testing of database systems
VLDB '07 Proceedings of the 33rd international conference on Very large data bases
Better reliability assessment of database based application software
ICC'05 Proceedings of the 9th International Conference on Circuits
ACM SIGSOFT Software Engineering Notes
| Hi-index | 0.00 |
This paper presents a method for test case selection that allows a formal approach to testing software. The two main ideas are (1) that testers create stochastic models of software behavior instead of crafting individual test cases and (2) that specific test cases are generated from the stochastic models and applied to the software under test. This paper describes a method for creating a stochastic model in the context of a solved example. We concentrate on Markov models and show how non‐Markovian behavior can be embedded in such models without violating the Markov property.